DocumentCode :
2860542
Title :
Growth and structure analysis of tungsten oxide nanorods using environmental transmission electron microscopy
Author :
Tokunaga, Tomoharu ; Kawamoto, Tadashi ; Tanaka, Kenta ; Nakamura, Naohiro ; Sasaki, Katsuhiro ; Kuroda, Kotaro ; Hayashi, Yasuhiko
Author_Institution :
Dept. of Quantum Eng., Nagoya Univ., Nagoya, Japan
fYear :
2011
fDate :
21-24 June 2011
Firstpage :
1
Lastpage :
2
Abstract :
The WO3 nanorods were fabricated in environmental transmission electron microscopy (ETEM) by simply heating it in oxygen atmosphere. Altough, WO3 nanorod showed high crystalline, but the stacking fault existed in nanorod. Furthermore, the nanorod was grown on tungsten wire through slit of oxide layer on it.
Keywords :
nanofabrication; nanorods; semiconductor growth; semiconductor materials; stacking faults; transmission electron microscopy; tungsten compounds; ETEM; WO3; crystalline; environmental transmission electron microscopy; growth analysis; nanofabrication; nanorod; oxide layer slit; oxygen atmosphere heating; stacking fault; structure analysis; Crystals; Face; Heating; Nanostructures; Tungsten; Wires; in-situ TEM; oxidation; tungsten;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoelectronics Conference (INEC), 2011 IEEE 4th International
Conference_Location :
Tao-Yuan
ISSN :
2159-3523
Print_ISBN :
978-1-4577-0379-9
Electronic_ISBN :
2159-3523
Type :
conf
DOI :
10.1109/INEC.2011.5991617
Filename :
5991617
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2860542
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