Title :
Substrate and load gate voltage compensation
Author :
Blaser, E. ; Chu, W. ; Sonoda, G.
Author_Institution :
IBM Corp., Hopewell Junction, NY, USA
Abstract :
A report on the application of on-chip substrate voltage and load-gate voltage compensation to minimize FET chip-to-chip power and performance variations.
Keywords :
Charge pumps; Circuit testing; Clocks; Delay effects; Detectors; Leakage current; Power dissipation; Switches; Threshold voltage; Timing;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1976 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1976.1155514
