Title :
A study on dimensions of feature space for text-independent speaker verification systems
Author :
Mansouri, A. ; Cardenas-Barrera, J. ; Castillo-Guerra, E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of New Brunswick, Fredericton, NB, Canada
Abstract :
This paper studies the effect of feature dimensions on an MFCC/IMFCC-GMM based text-independent speaker verification system (SVS). A typical baseline system is used to evaluate the impact of features based on the number of Mel, inverted Mel, delta and double delta coefficients while keeping other system parameters constant for all experiments. The relevance of the spectral information contained in the features according to their discrimination power was assessed through a GMM-UBM system with the TIMIT corpus. A new scoring method is reported in which the fusion of feature likelihoods is conducted before the UBM normalization. The study shows that features carrying high frequency spectral content have high information gain enabling better performance of the SVS. Similarly, adding more coefficients of MFCCs and IMFCCs instead of dynamic features such as delta and double delta coefficients improves the SVS´s equal error rate (EER). Our scoring technique outperformed the traditional scoring algorithm by 9.7%.
Keywords :
Gaussian processes; mixture models; speaker recognition; text analysis; GMM-UBM system; Gaussian mixture model; MFCC-IMFCC-GMM based text-independent speaker verification system; Mel coefficients; Mel-frequency cepstral coefficients; SVS; TIMIT corpus; UBM normalization; baseline system; double delta coefficients; dynamic features; equal error rate; feature dimensions; feature likelihoods; high frequency spectral content; information gain; inverted Mel coefficients; scoring method; spectral information; system parameters; Feature extraction; Mathematical model; Mel frequency cepstral coefficient; Speaker recognition; Speech; Speech recognition; GMM; IMFCC; MFCC; Score estimation; Speaker verification systems;
Conference_Titel :
Electrical and Computer Engineering (CCECE), 2015 IEEE 28th Canadian Conference on
Conference_Location :
Halifax, NS
Print_ISBN :
978-1-4799-5827-6
DOI :
10.1109/CCECE.2015.7129496