DocumentCode
2860986
Title
Simulated growth rates for single-bunch instabilities driven by a resistive impedance
Author
Towne, N.
Author_Institution
Nat. Synchrotron Light Source, Brookhaven Nat. Lab., Upton, NY
Volume
5
fYear
2003
fDate
12-16 May 2003
Firstpage
3168
Lastpage
3170
Abstract
Vlasov simulations of instabilities driven by resistive impedance are used to determine growth rates of single-bunch instabilities. A method for measuring synchrotron tunes and growth rates from simulated synchrotron sidebands is described. Simulated growth rates are compared with Oide´s calculation [K. Oide, Part. Accel. 51, 43 (1995)]
Keywords
particle beam stability; Vlasov simulations; resistive impedance; simulated growth rates; single-bunch instabilities; synchrotron sidebands; synchrotron tunes; Computational modeling; Damping; Frequency; Impedance; Laboratories; Light sources; Microwave theory and techniques; Resonance; Synchrotron radiation; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 2003. PAC 2003. Proceedings of the
Conference_Location
Portland, OR
ISSN
1063-3928
Print_ISBN
0-7803-7738-9
Type
conf
DOI
10.1109/PAC.2003.1289850
Filename
1289850
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