DocumentCode
2861037
Title
An evaluation of injection modeling
Author
Jaeger, Richard C.
Author_Institution
IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA
Volume
XIX
fYear
1976
fDate
18-20 Feb. 1976
Firstpage
96
Lastpage
97
Abstract
The degree to which the injection model predicts charge storage and current flow in the MTL structure and the errors which are introduced by the two-dimensional nature of the MTL device will be covered in this paper.
Keywords
Analytical models; Boundary conditions; Charge carrier density; Diodes; Equations; Impurities; Integrated circuit modeling; Predictive models;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1976 IEEE International
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/ISSCC.1976.1155541
Filename
1155541
Link To Document