Title :
An evaluation of injection modeling
Author :
Jaeger, Richard C.
Author_Institution :
IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA
Abstract :
The degree to which the injection model predicts charge storage and current flow in the MTL structure and the errors which are introduced by the two-dimensional nature of the MTL device will be covered in this paper.
Keywords :
Analytical models; Boundary conditions; Charge carrier density; Diodes; Equations; Impurities; Integrated circuit modeling; Predictive models;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1976 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1976.1155541
