DocumentCode
2861082
Title
Impact of I2L
Author
Thornton, C.
Author_Institution
US Army Electronics Command, Fort Monmouth, NJ, USA
Volume
XIX
fYear
1976
fDate
18-20 Feb. 1976
Firstpage
171
Lastpage
171
Abstract
Technological, business and economic factors that may limit or accelerate the use of I2L technology in logic, memory and linear/analog applications will be surveyed by I2L, CMOS, N-channel and bipolar specialists.
Keywords
CMOS technology; Companies; Costs; Economic forecasting; Isolation technology; Laboratories; Large scale integration; Logic; Production; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1976 IEEE International
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/ISSCC.1976.1155544
Filename
1155544
Link To Document