• DocumentCode
    2861127
  • Title

    An optical emission analysis of CH2F2 plasma polymerized nano-film growth

  • Author

    Huang, Chun ; Pan, Chien-Hsuan ; Tsai, Ching-Yuan

  • Author_Institution
    Dept. of Chem. Eng. & Mater. Sci., Yuan Ze Univ., Chungli, Taiwan
  • fYear
    2011
  • fDate
    21-24 June 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The optical emission analysis to plasma polymerized nano-film growth was studied. The objective of this study was to examine the distinctive glow features of low-temperature RF difluoromethane (CH2F2) plasma polymerization and its correlation with plasma polymerized nano-film surface characterizations. The photoemission plasma species in RF CH2F2 plasma polymerization was identified by optical emission spectroscopy (OES). The OES diagnosis data and deposition results evidently indicated that in CH2F2/Ar glow discharge, the polymerizable species resulted from the low-energy electron-impact dissociation of CH2F2 molecules that creates polymerizable species, but the strong Ar emission lines was related to nonpolymerizable species such as argon atom. In this study, the optical emission analysis indicates that the possible contribution of super hydrophobic plasma polymerized film growth is mainly occurred at the combination of electron-impact-dissociation and ionization.
  • Keywords
    carbon compounds; glow discharges; ionisation; photoemission; polymerisation; CH2F2; electron-impact dissociation; glow features; ionization; low-temperature RF difluoromethane plasma polymerization; optical emission analysis; optical emission spectroscopy; photoemission plasma species; plasma polymerized nano-film growth; plasma polymerized nano-film surface characterizations; Optical films; Optical polymers; Plasmas; Radio frequency; Stimulated emission; difluoromethane plasma; nano-hydrophobic thin film; optical emission spectra; plasma polymerization; surface characteristics);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2011 IEEE 4th International
  • Conference_Location
    Tao-Yuan
  • ISSN
    2159-3523
  • Print_ISBN
    978-1-4577-0379-9
  • Electronic_ISBN
    2159-3523
  • Type

    conf

  • DOI
    10.1109/INEC.2011.5991652
  • Filename
    5991652