DocumentCode :
2861177
Title :
Performance assessment of low temperature-grown GaAs-based optoelectronic devices dedicated to RF sampling applications
Author :
Delord, J.-M. ; Roux, J.-F. ; Coutaz, J.-L. ; Breuil, N.
Author_Institution :
IMEP-LAHC, Univ. of Savoie, Le Bourget du Lac, France
fYear :
2009
fDate :
14-19 June 2009
Firstpage :
1
Lastpage :
1
Abstract :
A large set of photoswitches (PSW) with different configurations is tested. Using the device with a shortest gap length leads to the generation of frequency harmonics while increasing RF input electrical power. Hence, the spurious free dynamic range (SFDR) is reduced when the RF power is increased up to 13 dBm. This results from an electrical nonlinear response which is partially due to carrier velocity saturation in LTG-GaAs. In accordance with the previous works, an electric field saturation of 14 kV/cm is measured.
Keywords :
III-V semiconductors; cryogenic electronics; gallium arsenide; optical switches; optoelectronic devices; semiconductor device testing; GaAs; GaAs-based optoelectronic devices; RF sampling; electric field saturation; electrical nonlinear response; frequency harmonic generation; photoswitch; spurious free dynamic range; Optical pulses; Optical sensors; Optical waveguides; Optoelectronic devices; Power system harmonics; Pump lasers; RF signals; Radio frequency; Sampling methods; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-4079-5
Electronic_ISBN :
978-1-4244-4080-1
Type :
conf
DOI :
10.1109/CLEOE-EQEC.2009.5196242
Filename :
5196242
Link To Document :
بازگشت