DocumentCode
2861419
Title
Simple method to measure laser linewidth using intensity noise spectrum based on Rayleigh Backscattering effect
Author
Nguyen, Quoc-Thai ; Besnard, Pascal ; Bramerie, Laurent ; Vaudel, Olivier ; Girault, Gwenaelle ; Leguillon, Y.
Author_Institution
FOTON - ENSSAT, Lannion, France
fYear
2009
fDate
14-19 June 2009
Firstpage
1
Lastpage
1
Abstract
In this paper, we propose a novel and simple method to measure the laser linewidth based on Rayleigh Backscattering (RB) effect. Our technique requires relative intensity noise (RIN) measurement. Contrary to DSHT, it avoids the use of an acousto-optic frequency-shifter, which infers the bandwidth detection and of a Mach-Zehnder interferometer.
Keywords
Rayleigh scattering; backscatter; laser variables measurement; noise measurement; optical noise; spectral line breadth; RB effect; RIN measurement; Rayleigh backscattering effect; intensity noise spectrum; laser linewidth measurement method; relative intensity noise measurement; Backscatter; Bandwidth; Delay lines; Frequency; Laser noise; Low-frequency noise; Mirrors; Noise measurement; Optical interferometry; Performance evaluation;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
Conference_Location
Munich
Print_ISBN
978-1-4244-4079-5
Electronic_ISBN
978-1-4244-4080-1
Type
conf
DOI
10.1109/CLEOE-EQEC.2009.5196258
Filename
5196258
Link To Document