Title :
Simple method to measure laser linewidth using intensity noise spectrum based on Rayleigh Backscattering effect
Author :
Nguyen, Quoc-Thai ; Besnard, Pascal ; Bramerie, Laurent ; Vaudel, Olivier ; Girault, Gwenaelle ; Leguillon, Y.
Author_Institution :
FOTON - ENSSAT, Lannion, France
Abstract :
In this paper, we propose a novel and simple method to measure the laser linewidth based on Rayleigh Backscattering (RB) effect. Our technique requires relative intensity noise (RIN) measurement. Contrary to DSHT, it avoids the use of an acousto-optic frequency-shifter, which infers the bandwidth detection and of a Mach-Zehnder interferometer.
Keywords :
Rayleigh scattering; backscatter; laser variables measurement; noise measurement; optical noise; spectral line breadth; RB effect; RIN measurement; Rayleigh backscattering effect; intensity noise spectrum; laser linewidth measurement method; relative intensity noise measurement; Backscatter; Bandwidth; Delay lines; Frequency; Laser noise; Low-frequency noise; Mirrors; Noise measurement; Optical interferometry; Performance evaluation;
Conference_Titel :
Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-4079-5
Electronic_ISBN :
978-1-4244-4080-1
DOI :
10.1109/CLEOE-EQEC.2009.5196258
