Title :
Near-field scanning acoustic microscope
Author :
Khuri-Yakub, B.T. ; Cinbis, C. ; Chou, C.H. ; Reinholdtsen, P.A.
Author_Institution :
W.W. Hansen Lab. of Phys., Stanford Univ., CA, USA
Abstract :
A traditional scanning acoustic microscope (SAM) has been modified to operate in the near-field mode. A pinhole in a thin shim of brass defines the resolution of the instrument, which can be as small as 0.1 λ. In an edge scan experiment, a 125-μm-thick brass shim with a pinhole size of 125 μm, a SAM operating at 3 MHz, and a transducer with an F-number of 0.7 are used. The improvement in resolution corresponds to using a transducer with an F-number of 0.2. The results of measurements of the line response of the system, using steel pinholes of several thicknesses and diameters at different linewidths and operating frequencies and showing the details of the design of the instrument, are presented
Keywords :
acoustic microscopes; 125 micron; 3 MHz; F-number; brass shim; design; diameters; edge scan experiment; line response; linewidths; new field scanning acoustic microscope; operating frequencies; pinhole size; steel pinholes; thicknesses; transducer; Anisotropic magnetoresistance; Current measurement; Gratings; Magnetic properties; Microscopy; Phase measurement; Slabs; Steel; Surface impedance; Transducers;
Conference_Titel :
Ultrasonics Symposium, 1989. Proceedings., IEEE 1989
Conference_Location :
Montreal, Que.
DOI :
10.1109/ULTSYM.1989.67098
