Title :
Operation of a low-temperature memory element
Author_Institution :
IBM Corp., Kingston, NY, USA
Abstract :
Presents an abstract of the conference paper.
Keywords :
Circuits; Current measurement; Fabrication; Joining processes; Magnetic field measurement; Magnetic fields; Persistent currents; Superconductivity; Temperature distribution;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1958 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1958.1155603
