• DocumentCode
    2862170
  • Title

    A new thermal switch design through CMOS MEMS fabrication process

  • Author

    Chou, Lei-Chun ; Lai, You-Liang ; Hou, Chun-Cheng ; Wang, Hui-Min ; Huang, Sheng-Chieh ; Chiou, Jin-Chern ; Tsai, Chun-Yin

  • Author_Institution
    Dept. of Electr. Control Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2011
  • fDate
    21-24 June 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The present study focuses on implementing a novel CMOS-MEMS thermal switch by using commercially available TSMC 0.35 μm two-poly four-metal (2P4M) CMOS process. There are two novel designs in this paper: first, the soft contact structure and post-processing fabrication; second, a new design of thermal actuator. To create the soft contact structure, residual stress effect has been utilized to make different bending curvatures. According to the experiments, the layer Metal-1 has the largest residual stress effect that can achieve the largest deflection in z-axis. Because the residual stress of the layer metal-1 is negative, the structure will bend down after release, the largest contact area which has been set up to get the lowest contact miss ability. In the post-processing fabrication, 0.3μm thickness gold will be patterned on the contact tips. Due to gold, rather than Aluminum, has no oxidation issue, it has more reliability on preventing the problem of oxidation than Aluminum. In the new thermal actuator design, we design a novel folded-flexure [2, 3] with the electrothermal excitation to turn the switch on or off. In the prototype, the device size is 500 μm * 400 μm and the gap between two contact pads is 9 μm in off-state. Depending on the simulation results, the switch can work stably at 3 volts, and the working temperature and operating bandwidth are individually 20-200 °C.
  • Keywords
    CMOS integrated circuits; actuators; internal stresses; microswitches; CMOS MEMS fabrication process; CMOS-MEMS thermal switch; TSMC two-poly four-metal CMOS process; aluminum; bending curvatures; electrothermal excitation; oxidation; post-processing fabrication; residual stress; size 0.35 mum; size 400 mum; size 500 mum; soft contact structure; temperature 20 degC to 200 degC; thermal actuator design; thermal switch design; voltage 3 V; Actuators; CMOS process; Contacts; Metals; Optical switches; Switching circuits; CMOS-MEMS; folded-flexure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2011 IEEE 4th International
  • Conference_Location
    Tao-Yuan
  • ISSN
    2159-3523
  • Print_ISBN
    978-1-4577-0379-9
  • Electronic_ISBN
    2159-3523
  • Type

    conf

  • DOI
    10.1109/INEC.2011.5991715
  • Filename
    5991715