DocumentCode
2862170
Title
A new thermal switch design through CMOS MEMS fabrication process
Author
Chou, Lei-Chun ; Lai, You-Liang ; Hou, Chun-Cheng ; Wang, Hui-Min ; Huang, Sheng-Chieh ; Chiou, Jin-Chern ; Tsai, Chun-Yin
Author_Institution
Dept. of Electr. Control Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear
2011
fDate
21-24 June 2011
Firstpage
1
Lastpage
2
Abstract
The present study focuses on implementing a novel CMOS-MEMS thermal switch by using commercially available TSMC 0.35 μm two-poly four-metal (2P4M) CMOS process. There are two novel designs in this paper: first, the soft contact structure and post-processing fabrication; second, a new design of thermal actuator. To create the soft contact structure, residual stress effect has been utilized to make different bending curvatures. According to the experiments, the layer Metal-1 has the largest residual stress effect that can achieve the largest deflection in z-axis. Because the residual stress of the layer metal-1 is negative, the structure will bend down after release, the largest contact area which has been set up to get the lowest contact miss ability. In the post-processing fabrication, 0.3μm thickness gold will be patterned on the contact tips. Due to gold, rather than Aluminum, has no oxidation issue, it has more reliability on preventing the problem of oxidation than Aluminum. In the new thermal actuator design, we design a novel folded-flexure [2, 3] with the electrothermal excitation to turn the switch on or off. In the prototype, the device size is 500 μm * 400 μm and the gap between two contact pads is 9 μm in off-state. Depending on the simulation results, the switch can work stably at 3 volts, and the working temperature and operating bandwidth are individually 20-200 °C.
Keywords
CMOS integrated circuits; actuators; internal stresses; microswitches; CMOS MEMS fabrication process; CMOS-MEMS thermal switch; TSMC two-poly four-metal CMOS process; aluminum; bending curvatures; electrothermal excitation; oxidation; post-processing fabrication; residual stress; size 0.35 mum; size 400 mum; size 500 mum; soft contact structure; temperature 20 degC to 200 degC; thermal actuator design; thermal switch design; voltage 3 V; Actuators; CMOS process; Contacts; Metals; Optical switches; Switching circuits; CMOS-MEMS; folded-flexure;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoelectronics Conference (INEC), 2011 IEEE 4th International
Conference_Location
Tao-Yuan
ISSN
2159-3523
Print_ISBN
978-1-4577-0379-9
Electronic_ISBN
2159-3523
Type
conf
DOI
10.1109/INEC.2011.5991715
Filename
5991715
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