DocumentCode
2862284
Title
The impact of gate insulator dielectric constant on performance of CNTFETs at different ambient temperatures
Author
Shirazi, Shaahin G. ; Mirzakuchaki, Sattar
Author_Institution
EE. Dept., Univ. of Sci. & Technol., Tehran, Iran
fYear
2011
fDate
21-24 June 2011
Firstpage
1
Lastpage
2
Abstract
Carbon nanotube field effect transistors are the most promising candidate for replacing of current silicon transistor technology. Choosing a suitable dielectric constant for a specific temperature range is important in determining device performance. For higher dielectric constant, rising up the temperature causes current ratio to diminish, while at lower dielectric constants the current ratio increases. An interesting case is observed for transistors with dielectric constants in the middle range which exhibit an approximately constant current ratio for all ambient temperatures considered.
Keywords
carbon nanotubes; field effect transistors; permittivity; CNTFET; ambient temperatures; carbon nanotube field effect transistors; gate insulator dielectric constant; silicon transistor technology; CNTFETs; Carbon nanotubes; Dielectric constant; Leakage current; Logic gates; Temperature; CNTFET; NEGF; ambient temperature; device performance; gate insulator dielectric;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoelectronics Conference (INEC), 2011 IEEE 4th International
Conference_Location
Tao-Yuan
ISSN
2159-3523
Print_ISBN
978-1-4577-0379-9
Electronic_ISBN
2159-3523
Type
conf
DOI
10.1109/INEC.2011.5991722
Filename
5991722
Link To Document