X-ray diffraction analysis of self-ordered porous anodic alumina

We report on the structural properties of porous anodic alumina (PAA) film produced by the anodization technique under different annealing temperatures. X-ray diffraction (XRD) measurement was performed and simulated by theoretical analysis model. From the analysis, it is found that sample prepared with higher annealing temperature exhibits larger interpore spacing and the pore array uniformity is slightly lowered down with higher annealing temperature. To verify the theoretical calculation results, images of the sample surfaces were obtained by field-emission scanning electron microscopic (FE-SEM). The FE-SEM images of the surface morphology of the samples are coinciding with the results obtained from XRD line profile analysis.