Title :
A 4096 x 1 static bipolar RAM
Author :
Herndon, W. ; Ho, W. ; Ramirez, R.
Author_Institution :
Fairchild Camera and Instrument Corp., Mountain View, CA, USA
Keywords :
Cameras; Decoding; Driver circuits; Fault location; Instruments; Logic; Parasitic capacitance; Product design; Random access memory; Read-write memory;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1977 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1977.1155629
