Title :
Calculating the uncertainty of a single measurement
Author_Institution :
Hewlett-Packard Ltd., Stockport, UK
Abstract :
The author discusses methods for evaluating measurement uncertainties and considers both the random uncertainties (Type A) and systematic uncertainties (Type B). A simplified method by which measurement uncertainties can be assessed and safeguards which can be built into the process to monitor the quality of the assessment, are presented
Keywords :
measurement errors; probability; random processes; measurement uncertainties; probability; random uncertainties; systematic uncertainties; test limits;
Conference_Titel :
Uncertainties in Electrical Measurement, IEE Colloquium on
Conference_Location :
London
