Title :
A 1024-bit, fused link CMOS PROM
Author :
Schroeder, Jochen ; Goslin, R.
Author_Institution :
Harris Semiconductor, Melbourne, FL, USA
Keywords :
CMOS memory circuits; CMOS technology; Circuit testing; Dielectrics; Fuses; Impedance; Nonvolatile memory; PROM; Power dissipation; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1977 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1977.1155652
