Title :
A mask programmable charge transfer analog multiplier
Author :
Goldberg, H. ; Engeler, W. ; Baertsch, R. ; Metz, J.
Author_Institution :
General Electric Corporate Research & Development Center, Schenectady, NY, USA
Keywords :
Charge coupled devices; Charge transfer; Chirp; Clocks; Electrodes; Fast Fourier transforms; Linearity; Shift registers; Testing; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1977 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1977.1155661
