DocumentCode :
2862882
Title :
3D finite element simulation of morphological effect on reflectance of Si3N4 sub-wavelength structures for silicon solar cells
Author :
Li, Yiming ; Lee, Ming-Yi ; Cheng, Hui-Wen ; Lu, Zheng-Liang ; Sahoo, Kartika Chandra ; Chang, Edward Yi
Author_Institution :
Dept. of Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear :
2011
fDate :
21-24 June 2011
Firstpage :
1
Lastpage :
2
Abstract :
In this work, three-dimensional (3D) study on the reflectance spectrum of silicon nitride (Si3N4) sub-wavelength structure (SWS) is conducted using finite element analysis. With proper boundary conditions, the morphological effect on reflectance property of cylinder-, right circular cone, and square pyramid-shape Si3N4 SWS is discussed.
Keywords :
elemental semiconductors; finite element analysis; reflectivity; silicon; silicon compounds; solar cells; surface morphology; 3D finite element simulation; Si; Si3N4; cylinder cone; morphological effect; reflectance property; reflectance spectrum; right circular cone; silicon nitride; silicon solar cells; square pyramid-shape; sub-wavelength structures; Boundary conditions; Finite element methods; Photovoltaic cells; Reflectivity; Silicon; Solid modeling; Three dimensional displays; 3D modeling; finite element simulation; reflectance; silicon nitride; solar cell; sub-wavelength structure;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoelectronics Conference (INEC), 2011 IEEE 4th International
Conference_Location :
Tao-Yuan
ISSN :
2159-3523
Print_ISBN :
978-1-4577-0379-9
Electronic_ISBN :
2159-3523
Type :
conf
DOI :
10.1109/INEC.2011.5991760
Filename :
5991760
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2862882
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