Title :
Modeling I2L performance and operational limits
Author :
Estreich, D. ; Dutton, Rachael
Author_Institution :
Stanford University, Stanford, CA, USA
Keywords :
Capacitance; Circuit simulation; Computational modeling; Computer simulation; Current measurement; Diodes; Knee; Logic; Resistors; Solid modeling;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1977 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1977.1155677
