DocumentCode

2863050

Title

Modeling I²L performance and operational limits

Author

Estreich, D. ; Dutton, Rachael

Author_Institution

Stanford University, Stanford, CA, USA

Volume

XX

fYear

1977

fDate

16-18 Feb. 1977

Firstpage

46

Lastpage

47

Keywords

Capacitance; Circuit simulation; Computational modeling; Computer simulation; Current measurement; Diodes; Knee; Logic; Resistors; Solid modeling;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference. Digest of Technical Papers. 1977 IEEE International

Conference_Location

Philadelphia, PA, USA

Type

conf

DOI

10.1109/ISSCC.1977.1155677

Filename

1155677