• DocumentCode
    2863157
  • Title

    Learning from Target Knowledge Approximation

  • Author

    Toh, Kar-Ann

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul
  • fYear
    2006
  • fDate
    24-26 May 2006
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    The classical least squares error (LSE) learning method for pattern classification is to learn a classifier based on data density where the learning process (density-fitting error minimization) and the learning objective (classification error rate) do not find a good match. In this work, we propose to learn according to classification decision objectives directly. We shall work on two classification objectives namely, the total error rate and the receiver operating characteristics, and directly optimize the learning process according to these objectives. Using a learning model which is linear in its parameters, we propose two approximation methods to optimize these classification objectives. Our empirical results on biometrics fusion show comparable performances of the proposed methods with the widely used support vector machines (SVM), with one of the approaches having a clear advantage of fast single-step solution
  • Keywords
    approximation theory; pattern classification; support vector machines; LSE learning method; SVM; biometrics fusion; classification error rate; classification objectives; density-fitting error minimization; learning objective; learning process; least squares error learning method; pattern classification; receiver operating characteristics; support vector machines; target knowledge approximation; total error rate; Approximation methods; Error analysis; Learning systems; Least squares approximation; Least squares methods; Minimization methods; Pattern classification; Pattern matching; Support vector machine classification; Support vector machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications, 2006 1ST IEEE Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    0-7803-9513-1
  • Electronic_ISBN
    0-7803-9514-X
  • Type

    conf

  • DOI
    10.1109/ICIEA.2006.257074
  • Filename
    4026003