Title :
Fault tolerant 92160 bit multiphase CCD memory
Author :
Elmer, B. ; Tchon, W. ; Denboer, A. ; Kohyama, S. ; Hirabayashi, K. ; Nojima, I.
Author_Institution :
Honeywell Information Systems, Inc., Phoenix, AZ, USA
Keywords :
Charge coupled devices; Clocks; Fault tolerance; Fault tolerant systems; Fuses; Information systems; Registers; Solid state circuits; Testing; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1977 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1977.1155685
