• DocumentCode
    2863197
  • Title

    Closed-loop control of a base XY stage with rotational degree-of-freedom for a high-speed ultra-accurate manufacturing system

  • Author

    Melkote, Hemant ; Khorrami, Farshad

  • Author_Institution
    Control/Robotics Res. Lab., Polytech. Univ., Brooklyn, NY, USA
  • Volume
    3
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1812
  • Abstract
    Modeling and control of a high-speed ultra-accurate XY stage used in manufacturing systems is considered in this paper. The base XY stage is a two dimensional linear stepper (Sawyer) motor including a rotational (yaw) degree-of-freedom. Manufacturing systems based on Sawyer motors are widely used in wafer probing applications and in automated assembly. A Sawyer sensor is being integrated for measuring the motor´s position, velocity and yaw rotation for closed-loop control purposes on our testbed at the CRRL. Utilizing results on robust control of nonlinear systems, an adaptive current-level controller is designed for the motor that renders the closed-loop system robust to a variety of uncertainties and disturbances. A detailed model of the motor that takes into account the significant uncertainties of the motor is used in the control design. The tracking error is shown to asymptotically converge to the origin. Simulation studies are presented to validate the controller performance
  • Keywords
    adaptive control; closed loop systems; control system synthesis; convergence; industrial robots; linear motors; nonlinear control systems; robust control; stepping motors; 2D linear stepper motor; CRRL; Sawyer motor; Sawyer sensor; adaptive current-level controller; asymptotic convergence; automated assembly; base XY stage; closed-loop control; control design; high-speed ultra-accurate manufacturing system; nonlinear systems; robust control; rotational DOF; wafer probing; yaw DOF; Assembly systems; Automatic control; Manufacturing systems; Position measurement; Robust control; Rotation measurement; Semiconductor device modeling; Testing; Velocity control; Velocity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Robotics and Automation, 1999. Proceedings. 1999 IEEE International Conference on
  • Conference_Location
    Detroit, MI
  • ISSN
    1050-4729
  • Print_ISBN
    0-7803-5180-0
  • Type

    conf

  • DOI
    10.1109/ROBOT.1999.770372
  • Filename
    770372