DocumentCode :
2863243
Title :
A unique art purifying the atomic scale, zone selective, and quantitative information of bonding and electronic dynamics at sites surrounding defects, surfaces, and interfaces
Author :
Nie, Yanguang ; Pan, Jisheng ; Sun, Chang Q.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2011
fDate :
21-24 June 2011
Firstpage :
1
Lastpage :
2
Abstract :
With the theory enabled technology, we have been able to purify information from zones up to two atomic spacings regarding the evolution of the bond length, bond strength, energy density, and the energetic behavior of the localized core and valence electrons by filtering out the bulk and background information, which enabled us to identify the direction of charge flow in the catalytic reactions between the gaseous specimens and the Rh and Pt adatoms catalysts, and between the gaseous specimens and the CuPd and AgPd nanoalloys. With the special technique, we have also been able to clarify that the Dirac-Fermi polarons detected using STM/S as high protrusions with resonance at Fermi energy as arising from the polarization of the unpaired dangling-bond electrons by the undercoordination-induced local densification and quantum entrapment of the energetically low-lying electrons, which in turn screen and split the crystal potential adding another extra component in the upper edge of the core band.
Keywords :
Fermi level; bond lengths; dangling bonds; Dirac-Fermi polarons; Fermi energy; atomic scale; atomic spacings; bond length; bond strength; dangling-bond electrons; electronic dynamics; energetic behavior; energetically low-lying electrons; energy density; localized core; nanoalloys; quantitative information; quantum entrapment; valence electrons; zone selective; Bonding; Filtering; Industries; Materials; Metals; Monitoring; Sun;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoelectronics Conference (INEC), 2011 IEEE 4th International
Conference_Location :
Tao-Yuan
ISSN :
2159-3523
Print_ISBN :
978-1-4577-0379-9
Electronic_ISBN :
2159-3523
Type :
conf
DOI :
10.1109/INEC.2011.5991783
Filename :
5991783
Link To Document :
بازگشت