Title :
I2L timing circuit without external components
Author_Institution :
Siemens AG, Munich, Germany
Keywords :
Circuit testing; Current supplies; Delay; Integrated circuit technology; Logic circuits; Logic testing; Pulse amplifiers; Ring oscillators; Solid state circuits; Timing;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1977 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1977.1155690
