DocumentCode :
2863320
Title :
An analog-to-digital converter using charge-transfer technology
Author :
Eichelberger, Chris ; Butler, W.
Author_Institution :
General Electric Corp. Research and Development Center, Schenectady, NY, USA
Volume :
XX
fYear :
1977
fDate :
16-18 Feb. 1977
Firstpage :
94
Lastpage :
95
Keywords :
Analog-digital conversion; Capacitors; Charge measurement; Current measurement; Integrated circuit measurements; Large scale integration; MOSFET circuits; Microprocessors; Semiconductor device measurement; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1977 IEEE International
Conference_Location :
Philadelphia, PA, USA
Type :
conf
DOI :
10.1109/ISSCC.1977.1155694
Filename :
1155694
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2863320
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