• DocumentCode
    2863434
  • Title

    Electrical transport in carbon nanotube intermolecular p-n junctions

  • Author

    Li, Hong ; Zhang, Qing ; Yap, Chin Chong ; Tay, Beng Kang

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2011
  • fDate
    21-24 June 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Thermionic emission and tunneling are found to be the dominant transport mechanisms under the forward and reverse bias conditions, respectively, in a single-walled carbon nanotube based intermolecular p-n junction. At a reverse bias, the kink point on the plot of ln(I/V2) vs 1/V indicates that the transport mechanism experiences a transition from direct tunneling to the Fowler-Nordheim tunneling through the junction barrier. In contrast, the Arrhenius plot of the I-V curve at forward biases shows that tunneling dominates over the thermionic emission below 50 K.
  • Keywords
    carbon nanotubes; p-n junctions; thermionic emission; tunnelling; electrical transport; intermolecular p-n junction; junction barrier; single-walled carbon nanotube; thermionic emission; tunneling; Carbon nanotubes; Electrodes; Fitting; P-n junctions; Thermionic emission; Tunneling; carbon nanotubes; intermolecular p-n junction; transport mechanism;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2011 IEEE 4th International
  • Conference_Location
    Tao-Yuan
  • ISSN
    2159-3523
  • Print_ISBN
    978-1-4577-0379-9
  • Electronic_ISBN
    2159-3523
  • Type

    conf

  • DOI
    10.1109/INEC.2011.5991794
  • Filename
    5991794