DocumentCode :
2863609
Title :
Self-diffraction SPIDER
Author :
Birkholz, Simon ; Bethge, Jens ; Grebing, Christian ; Koke, Sebastian ; Steinmeyer, Günter
Author_Institution :
Max Born Inst., Berlin, Germany
fYear :
2009
fDate :
14-19 June 2009
Firstpage :
1
Lastpage :
1
Abstract :
The work investigates the much more broadband self-diffraction (SD) process as an alternative for SPIDER (spectral phase interferometry for direct electric field reconstruction) pulse characterization. To the best of the authors´ knowledge, this constitutes the first experimental demonstration of a chi(3) based SPIDER apparatus. For a first experimental demonstration, SD SPIDER setup is employed to characterize amplified pulses from a Ti:sapphire laser with about 20 fs pulse duration.
Keywords :
laser beams; laser variables measurement; light diffraction; light interferometry; nonlinear optical susceptibility; optical pulse generation; pulse measurement; Al2O3:Ti; Ti:sapphire laser; pulse characterization; self-diffraction SPIDER; spectral phase interferometry for direct electric field reconstruction; Bandwidth; Frequency conversion; Nonlinear optics; Optical frequency conversion; Optical harmonic generation; Optical mixing; Optical pulses; Phase measurement; Pulse amplifiers; Pulse measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-4079-5
Electronic_ISBN :
978-1-4244-4080-1
Type :
conf
DOI :
10.1109/CLEOE-EQEC.2009.5196394
Filename :
5196394
Link To Document :
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