DocumentCode :
2863636
Title :
Avoidance of ESD effects
Author :
Rhoades, William T.
Author_Institution :
Xerox Corp., El Segundo, CA, USA
fYear :
1988
fDate :
2-4 Aug 1988
Firstpage :
184
Lastpage :
189
Abstract :
The problem of avoiding electrostatic discharge (ESD) in electronic circuits is addressed. The best design approach for ESD is no current discharges for direct ESD events and a cost-effective internal shield for indirect ESD events. It is shown that there can be a conflict between emission and ESD designs. When ESD current flows, the current is always common-mode current. Even the correct model for the resistance of the arc discharge is dependent on the rate of closure between the intruder and the reception. Because of this, protection could range from inadequate to overdesign with present-day test generators. The fields near the arc discharge path are predominantly magnetic and some useful relationships are given. Radiation pickup depends on surface impedance, slot openings and separation distance between the arc and the sensitive circuit(s)
Keywords :
electrostatics; integrated circuit testing; ESD current; ESD effects avoidance; VLSI; arc discharge; common-mode current; current discharges; direct ESD events; electronic circuits; indirect ESD events; internal shield; magnetic fields; protection; radiation pickup; separation distance; slot openings; surface impedance; Arc discharges; Costs; Electrostatic discharge; Electrostatic interference; Fault location; Humans; Protection; Switches; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1988. Symposium Record., IEEE 1988 International Symposium on
Conference_Location :
Seattle, WA
Type :
conf
DOI :
10.1109/ISEMC.1988.14110
Filename :
14110
Link To Document :
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