• DocumentCode
    2863636
  • Title

    Avoidance of ESD effects

  • Author

    Rhoades, William T.

  • Author_Institution
    Xerox Corp., El Segundo, CA, USA
  • fYear
    1988
  • fDate
    2-4 Aug 1988
  • Firstpage
    184
  • Lastpage
    189
  • Abstract
    The problem of avoiding electrostatic discharge (ESD) in electronic circuits is addressed. The best design approach for ESD is no current discharges for direct ESD events and a cost-effective internal shield for indirect ESD events. It is shown that there can be a conflict between emission and ESD designs. When ESD current flows, the current is always common-mode current. Even the correct model for the resistance of the arc discharge is dependent on the rate of closure between the intruder and the reception. Because of this, protection could range from inadequate to overdesign with present-day test generators. The fields near the arc discharge path are predominantly magnetic and some useful relationships are given. Radiation pickup depends on surface impedance, slot openings and separation distance between the arc and the sensitive circuit(s)
  • Keywords
    electrostatics; integrated circuit testing; ESD current; ESD effects avoidance; VLSI; arc discharge; common-mode current; current discharges; direct ESD events; electronic circuits; indirect ESD events; internal shield; magnetic fields; protection; radiation pickup; separation distance; slot openings; surface impedance; Arc discharges; Costs; Electrostatic discharge; Electrostatic interference; Fault location; Humans; Protection; Switches; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1988. Symposium Record., IEEE 1988 International Symposium on
  • Conference_Location
    Seattle, WA
  • Type

    conf

  • DOI
    10.1109/ISEMC.1988.14110
  • Filename
    14110