Title :
A methodology for expedient analysis of the impact of disorder in periodic waveguides
Author :
Ochoa, Juan S. ; Cangellaris, Andreas C.
Author_Institution :
University of Illinois at Urbana-Champaign, Urbana, 61801, United States
Abstract :
An expedient methodology is presented for the predictive analysis of the impact of statistical disorder on the electromagnetic attributes of periodic waveguides. The proposed methodology makes use of ideas from the Anderson localization theory to derive closed-form expressions for the calculation of an effective exponential decay ratio that quantifies the impact of periodicity disorder on the transmission properties of the waveguide. The computational efficiency of the proposed method over Monte Carlo based alternatives is demonstrated through a specific example involving a periodically-loaded parallel plate waveguide.
Keywords :
Electromagnetic waveguides; Electromagnetics; Mathematical model; Monte Carlo methods; Periodic structures; Random variables; Standards; Localization; Monte Carlo analysis; disorder; finite element method; periodic structure;
Conference_Titel :
Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
Conference_Location :
Montreal, QC, Canada
Print_ISBN :
978-1-4673-1085-7
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2012.6259425