Contents

The main aim of CADSM Conference is to provide a possibility to discuss problems of optimization of technological processes of IC manufacturing, main aspects of the development of models and methods of microelectronics devices and technical systems, and, of course, problems that take place during microelectromechanical systems design. Traditionally, the problems of testing and reliability are considered within the framework of the Conference, as well as the new information technologies of automated design and development of learning systems. With an attempt to achieve these objectives, different aspects of the advanced microelectronic design, testing and manufacturing will be presented on the Conference. The topics of the Conference have been very carefully chosen, so that they reflect the crucial issues of CAD. The main topics to discuss this year are the following: 1. modelling and optimization for technological processes. 2. models and methods for radioelectronics device and system design. 3. design of specialized systems and devices. 4. optimal design problems. 5. CAD modern information technology. 6. models and methods for microelectromechanical systems. 7. applied and computer linguistics. The presented papers will cover different areas of design, analysis, simulation and testing of microelectronic circuits and microsystems, as well as power devices. Following our traditions, the discussion on training and technology transfer, as well as education and teaching experience, in the field of design and application of integrated circuits will be held.