DocumentCode
2863838
Title
Wafer sort trimming of analog ICs
Author
Lillis, W.
Author_Institution
Motorola, Inc., Phoenix, AZ, USA
Volume
XX
fYear
1977
fDate
16-18 Feb. 1977
Firstpage
90
Lastpage
90
Keywords
Analog integrated circuits; Availability; Capacitors; Circuit testing; Costs; Digital-analog conversion; Linearity; Manufacturing processes; Operational amplifiers; Resistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1977 IEEE International
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/ISSCC.1977.1155724
Filename
1155724
Link To Document