DocumentCode :
2863838
Title :
Wafer sort trimming of analog ICs
Author :
Lillis, W.
Author_Institution :
Motorola, Inc., Phoenix, AZ, USA
Volume :
XX
fYear :
1977
fDate :
16-18 Feb. 1977
Firstpage :
90
Lastpage :
90
Keywords :
Analog integrated circuits; Availability; Capacitors; Circuit testing; Costs; Digital-analog conversion; Linearity; Manufacturing processes; Operational amplifiers; Resistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1977 IEEE International
Conference_Location :
Philadelphia, PA, USA
Type :
conf
DOI :
10.1109/ISSCC.1977.1155724
Filename :
1155724
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2863838
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