DocumentCode :
2863959
Title :
Profiling of Carrier Density in Semiconductor Lasers via Spectral Analysis of Side Spontaneous Emission
Author :
Sargent, E.H. ; Pavlidis, Dimitris
fYear :
1996
fDate :
8-13 Sept. 1996
Firstpage :
166
Lastpage :
166
Keywords :
Birefringence; Charge carrier density; Laser modes; Optical polarization; Optical refraction; Semiconductor lasers; Spectral analysis; Spontaneous emission; Surface emitting lasers; Vertical cavity surface emitting lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-optics Europe, 1996. CLEO/Europe., Conference on
Conference_Location :
Hamburg, Germany
Print_ISBN :
0-7803-3169-9
Type :
conf
DOI :
10.1109/CLEOE.1996.562261
Filename :
562261
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2863959
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