Title :
Stress-induced phase matching in Silicon waveguides
Author :
Raghunathan, Varun ; Jalali, Bahram
Author_Institution :
Electr. Eng. Dept., Univ. of California Los Angeles, Los Angeles, CA
Abstract :
This paper presents the first demonstration of phase matching in silicon waveguides. Phase matching is achieved by canceling the intrinsic waveguide dispersion by stress-induced tuning of birefringence. A 12 dB enhancement in CARS wavelength conversion efficiency is observed.
Keywords :
birefringence; coherent antiStokes Raman scattering; optical phase matching; optical waveguides; optical wavelength conversion; silicon; stress effects; CARS wavelength conversion efficiency; Si; birefringence; intrinsic waveguide dispersion; silicon waveguides; stress-induced phase matching; stress-induced tuning; Birefringence; Frequency conversion; Nonlinear optics; Optical films; Optical frequency conversion; Optical waveguides; Optical wavelength conversion; Silicon; Stress; Tellurium; (130.3120) Integrated optics devices; (190.4380) Nonlinear optics, four-wave mixing; (190.5650) Raman effect; (230.7370) Waveguides;
Conference_Titel :
Lasers and Electro-Optics, 2006 and 2006 Quantum Electronics and Laser Science Conference. CLEO/QELS 2006. Conference on
Conference_Location :
Long Beach, CA
Print_ISBN :
978-1-55752-813-1
Electronic_ISBN :
978-1-55752-813-1
DOI :
10.1109/CLEO.2006.4627792
