• DocumentCode
    2864061
  • Title

    Micro object handling under SEM by vision-based automatic control

  • Author

    Kasaya, Takeshi ; Miyazaki, Hideki ; Saito, David ; Sato, Tomomasa

  • Author_Institution
    Dept. of Mechatronics, Tokyo Eng. Univ., Japan
  • Volume
    3
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    2189
  • Abstract
    There is a great demand for the highly accurate and reliable arrangement of micro objects smaller than 100 μm in order to construct micro devices. Since micro objects tend to adhere to other objects by electrostatic force, it is possible to pick them up easily by contact with a needle tip instead of grasping by tweezers. On the other hand, it is difficult to place them on a substrate. To solve this problem, we have proposed a handling method by controlling the contact face area, i.e. picking up the object by contact with the center of the tool-tip plane, and placing it by contact with the edge and also inclining the tool. However, it is difficult to execute this operation by manual control, because it requires delicate movement by the manipulator, in order not to break the object or flip it away. In this study, we automate this pick-and-place operation by visual and force control. Moreover, to arrange micro objects with high accuracy and reliability, all necessary functions such as calibration, object search, and positioning are integrated, and an automatic handling system is constructed. We successfully demonstrated a completely automatic arrangement of several micro objects of 30 μm in diameter under SEM monitoring
  • Keywords
    force control; image recognition; micromanipulators; micropositioning; optical microscopes; scanning electron microscopy; SEM monitoring; automatic handling system; delicate movement; micro devices; micro object handling; object search; pick-and-place operation; positioning; vision-based automatic control; Adhesives; Automatic control; Calibration; Computerized monitoring; Electrostatics; Force control; Human factors; Mechatronics; Needles; Scanning electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Robotics and Automation, 1999. Proceedings. 1999 IEEE International Conference on
  • Conference_Location
    Detroit, MI
  • ISSN
    1050-4729
  • Print_ISBN
    0-7803-5180-0
  • Type

    conf

  • DOI
    10.1109/ROBOT.1999.770431
  • Filename
    770431