Title :
A technique for electrically measuring the thermal resistance of GaAs bulk resistors
Author :
Sabin, Edwin ; Scarpulla, John ; Chou, Yeong-Chang ; Shimamoto, Gene
Author_Institution :
TRW Inc., Redondo Beach, CA, USA
Abstract :
An electrical technique to measure the thermal resistance of GaAs bulk resistors is presented. The thermal resistance of several resistors was determined. The difference in these results relative to a liquid crystal method is discussed. Then, the reliability impact on the resistors from self-heating is studied
Keywords :
III-V semiconductors; gallium arsenide; resistors; semiconductor device reliability; thermal resistance; thermal resistance measurement; GaAs; Seebeck effect; bulk resistors; reliability; self-heating; thermal resistance measurement; Current measurement; Electric resistance; Electric variables measurement; Electrical resistance measurement; Gallium arsenide; Geometry; Liquid crystals; Resistors; Temperature measurement; Thermal resistance;
Conference_Titel :
GaAs Reliability Workshop, 2000. Proceedings
Conference_Location :
Seattle, WA
Print_ISBN :
0-7908-0102-7
DOI :
10.1109/GAASRW.2000.902421
