Title :
The reliability of short length GaAs bulk resistors
Author :
Sabin, Edwin ; Scarpulla, John ; Chou, Yeong-Chang
Author_Institution :
TRW Inc., Redondo Beach, CA, USA
Abstract :
The reliability of short length bulk resistors is evaluated for design current density stressing and for highly accelerated stressing. The failure modes for these different stress conditions are compared and a mechanism is proposed to explain these failure modes
Keywords :
III-V semiconductors; current density; gallium arsenide; resistors; semiconductor device reliability; GaAs; current density stressing; failure modes; highly accelerated stressing; reliability; short length GaAs bulk resistors; Acceleration; Current density; Gallium arsenide; MMICs; Ovens; Resistors; Stress; Temperature; Testing; Voltage;
Conference_Titel :
GaAs Reliability Workshop, 2000. Proceedings
Conference_Location :
Seattle, WA
Print_ISBN :
0-7908-0102-7
DOI :
10.1109/GAASRW.2000.902422
