DocumentCode :
2864201
Title :
Session 8 overview microwave subsystems and measurements
Author :
Chang Wen
Author_Institution :
Rockwell Int´´l-Collins Radio, Richardson, TX, USA
Volume :
XX
fYear :
1977
fDate :
16-18 Feb. 1977
Firstpage :
81
Lastpage :
81
Abstract :
Presents a synopsis of the sessions held at the conference proceedings.
Keywords :
Microwave subsystems and measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1977 IEEE International
Conference_Location :
Philadelphia, PA, USA
Type :
conf
DOI :
10.1109/ISSCC.1977.1155746
Filename :
1155746
Link To Document :
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