DocumentCode
2864323
Title
An empirical Bayes approach to detect anomalies in dynamic multidimensional arrays
Author
Agarwal, Deepak
Author_Institution
AT&T Labs-Res., Florham Park, NJ, USA
fYear
2005
fDate
27-30 Nov. 2005
Abstract
We consider the problem of detecting anomalies in data that arise as multidimensional arrays with each dimension corresponding to the levels of a categorical variable. In typical data mining applications, the number of cells in such arrays is usually large. Our primary focus is detecting anomalies by comparing information at the current time to historical data. Naive approaches advocated in the process control literature do not work well in this scenario due to the multiple testing problems - performing multiple statistical tests on the same data produce excessive number of false positives. We use an empirical Bayes method which works by fitting a two component Gaussian mixture to deviations at current time. The approach is scalable to problems that involve monitoring massive number of cells and fast enough to be potentially useful in many streaming scenarios. We show the superiority of the method relative to a naive "per component error rate" procedure through simulation. A novel feature of our technique is the ability to suppress deviations that are merely the consequence of sharp changes in the marginal distributions. This research was motivated by the need to extract critical application information and business intelligence from the daily logs that accompany large-scale spoken dialog systems deployed by AT&T. We illustrate our method on one such system.
Keywords
Bayes methods; Gaussian processes; data mining; Gaussian mixture; anomaly detection; business intelligence; data mining; dynamic multidimensional arrays; empirical Bayes approach; large-scale spoken dialog systems; Computational intelligence; Data mining; Databases; Large-scale systems; Monitoring; Multidimensional systems; Performance evaluation; Process control; Statistics; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Data Mining, Fifth IEEE International Conference on
ISSN
1550-4786
Print_ISBN
0-7695-2278-5
Type
conf
DOI
10.1109/ICDM.2005.22
Filename
1565658
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