Title :
A 1024-bit nonvolatile 15ns bipolar read-write memory
Author :
Shanks, R. ; Davis, Chris
Author_Institution :
Burroughs Corp., San Diego, CA, USA
Keywords :
Amorphous materials; Capacitance; Circuit testing; Glass; Life testing; Nonvolatile memory; Read-write memory; Solids; Sputtering; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1978 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1978.1155755
