Title :
FTA technique addressing fault criticality and interactions in complex consumer communications
Author :
Verbitsky, David E. ; Lucent, Paul Franklin
Author_Institution :
Adv. American Telephones, Eatontown, NJ, USA
Abstract :
Limitations of conventional fault tree analysis (FTA) application to modern consumer electronics are outlined, and the necessity for an upgraded FTA is justified. Field and manufacturing failure modes, mechanisms and their interactions are arranged into a unified rank system. An advanced failure tree is developed; new application specific gates are substantiated and introduced. Detailed analysis, formulas, typical examples and recommendations are presented. It is shown that degree/accuracy of mathematical description is determined based on demands of practical accuracy. Broader application of the methodology is justified
Keywords :
consumer electronics; fault trees; advanced failure tree; application specific gates; complex consumer communications; fault criticality; fault interactions; fault tree analysis; manufacturing failure modes; mechanisms; unified rank system; Cause effect analysis; Circuit faults; Circuit testing; Consumer electronics; Failure analysis; Integrated circuit manufacture; Modems; Stress; Telephony; US Department of Transportation;
Conference_Titel :
Reliability and Maintainability Symposium, 2001. Proceedings. Annual
Conference_Location :
Philadelphia, PA
Print_ISBN :
0-7803-6615-8
DOI :
10.1109/RAMS.2001.902436
