Title :
Session 16 LSI design, testing and interfacing
Author_Institution :
IBM Corp., Hopwell Junction, NY, USA
Abstract :
Presents a synopsis of the sessions held at the conference proceedings.
Keywords :
LSI design; Testing and interfacing;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1978 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1978.1155764
