DocumentCode :
2864469
Title :
Labeling unclustered categorical data into clusters based on the important attribute values
Author :
Chen, Hung-Leng ; Chuang, Kun-Ta ; Chen, Ming-Syan
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2005
fDate :
27-30 Nov. 2005
Abstract :
Sampling has been recognized as an important technique to improve the efficiency of clustering. However, with sampling applied, those points which are not sampled will not have their labels. Although there is a straightforward approach in the numerical domain, the problem of how to allocate those unlabeled data points into proper clusters remains as a challenging issue in the categorical domain. In this paper, a mechanism named MAximal Resemblance Data Labeling (abbreviated as MARDL) is proposed to allocate each unlabeled data point into the corresponding appropriate cluster based on the novel categorical clustering representative, namely, Node Importance Representative (abbreviated as NIR), which represents clusters by the importance of attribute values. MARDL has two advantages: (1) MARDL exhibits high execution efficiency; (2) after each unlabeled data is allocated into the proper cluster, MARDL preserves clustering characteristics, i.e., high intra-cluster similarity and low inter-cluster similarity. MARDL is empirically validated via real and synthetic data sets, and is shown to be not only more efficient than prior methods but also attaining results of better quality.
Keywords :
data mining; database management systems; pattern clustering; sampling methods; categorical clustering; data mining; important attribute values; maximal resemblance data labeling; node importance representative; sampling technique; unclustered categorical data; Clustering algorithms; Data mining; Databases; Information retrieval; Labeling; Machine learning; NP-hard problem; Pattern recognition; Sampling methods; categorical clustering; data labeling; data mining;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Data Mining, Fifth IEEE International Conference on
ISSN :
1550-4786
Print_ISBN :
0-7695-2278-5
Type :
conf
DOI :
10.1109/ICDM.2005.85
Filename :
1565668
Link To Document :
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