• DocumentCode
    2864526
  • Title

    A conditional-reliability control-chart for the post-production extended reliability-test

  • Author

    Sun, Feng-Bin ; Yang, Jimmy ; Rosario, Ramon Del ; Murphy, Richard

  • Author_Institution
    Quantum Corp., Milpitas, CA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    64
  • Lastpage
    69
  • Abstract
    This paper presents a new failure-percent control chart which is based on the conditional reliability of the sequential life tests. It provides a better reliability monitoring tool than the existing SPRT chart because: (1) the new control chart calculates and plots the failure percent batch by batch separately without mixing them and accumulating run hours and number of failures across batches, and therefore provides higher sensitivity of catching manufacturing aberration; (2) the new control chart does not assume a constant failure rate; (3) no assumption needs to be made on the population homogeneity; and (4) it is easier to trace back to the troublemaking batch, fix the problem and conduct more in-depth risk assessment. It is also found the proposed monitoring tool is not sensitive to the Weibull shape parameter selection in its actual feasible range
  • Keywords
    failure analysis; production; quality control; reliability; testing; Weibull shape parameter selection; conditional reliability; conditional-reliability control-chart; failure percent; failure rate; failure-percent control chart; in-depth risk assessment; manufacturing aberration; population homogeneity; post-production extended reliability-test; reliability monitoring tool; sequential life tests; troublemaking batch; Acoustic testing; Condition monitoring; Control charts; Hard disks; Life estimation; Life testing; Manufacturing; Quantum computing; Sequential analysis; Sun;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2001. Proceedings. Annual
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-6615-8
  • Type

    conf

  • DOI
    10.1109/RAMS.2001.902443
  • Filename
    902443