DocumentCode
2864526
Title
A conditional-reliability control-chart for the post-production extended reliability-test
Author
Sun, Feng-Bin ; Yang, Jimmy ; Rosario, Ramon Del ; Murphy, Richard
Author_Institution
Quantum Corp., Milpitas, CA, USA
fYear
2001
fDate
2001
Firstpage
64
Lastpage
69
Abstract
This paper presents a new failure-percent control chart which is based on the conditional reliability of the sequential life tests. It provides a better reliability monitoring tool than the existing SPRT chart because: (1) the new control chart calculates and plots the failure percent batch by batch separately without mixing them and accumulating run hours and number of failures across batches, and therefore provides higher sensitivity of catching manufacturing aberration; (2) the new control chart does not assume a constant failure rate; (3) no assumption needs to be made on the population homogeneity; and (4) it is easier to trace back to the troublemaking batch, fix the problem and conduct more in-depth risk assessment. It is also found the proposed monitoring tool is not sensitive to the Weibull shape parameter selection in its actual feasible range
Keywords
failure analysis; production; quality control; reliability; testing; Weibull shape parameter selection; conditional reliability; conditional-reliability control-chart; failure percent; failure rate; failure-percent control chart; in-depth risk assessment; manufacturing aberration; population homogeneity; post-production extended reliability-test; reliability monitoring tool; sequential life tests; troublemaking batch; Acoustic testing; Condition monitoring; Control charts; Hard disks; Life estimation; Life testing; Manufacturing; Quantum computing; Sequential analysis; Sun;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2001. Proceedings. Annual
Conference_Location
Philadelphia, PA
ISSN
0149-144X
Print_ISBN
0-7803-6615-8
Type
conf
DOI
10.1109/RAMS.2001.902443
Filename
902443
Link To Document