DocumentCode :
2864623
Title :
Transparent metal electrodes
Author :
Ghosh, D.S. ; Martinez, L. ; Pruneri, V.
Author_Institution :
ICFO, Castelldefels, Spain
fYear :
2009
fDate :
14-19 June 2009
Firstpage :
1
Lastpage :
1
Abstract :
A crucial challenge in the optoelectronics industry is the realization of cheap and reliable transparent electrodes, i.e. films that permit to bring electrical current or potentials in proximity of optically active regions without significant loss of optical energy. The state of the art solution lies in large band gap semiconductors heavily doped with metals, known as transparent conductive oxides (TCOs), including indium tin oxide (ITO). Metal films, when sufficiently thin (<10 nm), become transparent to light, still maintaining continuity, thus having good electrical properties. This paper discusses, with respect to ITO, that ultrathin metal films (UTMFs) can possess similar levels of transparency in the visible range, larger UV and IR transmittance and larger electrical conductivity. AFM images reveal that RMS roughness and a peak-to-valley level are found to be 0.3 and 1.7 nm, respectively, both being well below deposited thickness.
Keywords :
atomic force microscopy; electrical conductivity; electrodes; indium compounds; metallic thin films; nickel; semiconductor thin films; surface roughness; tin compounds; transparency; wide band gap semiconductors; AFM; IR transmittance; InSnO; Ni; RMS roughness; UV transmittance; peak-to-valley level; that ultrathin metal films; transparency; transparent metal electrodes; Conducting materials; Electric potential; Electrodes; Indium tin oxide; Metals industry; Optical films; Photovoltaic cells; Semiconductor films; Semiconductor materials; Solar energy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-4079-5
Electronic_ISBN :
978-1-4244-4080-1
Type :
conf
DOI :
10.1109/CLEOE-EQEC.2009.5196451
Filename :
5196451
Link To Document :
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