DocumentCode

2864627

Title

Stratified charge memory

Author

Erb, Dominik

Author_Institution

Mountain View, CA, USA

Volume

XXI

fYear

1978

fDate

15-17 Feb. 1978

Firstpage

24

Lastpage

25

Keywords

Application specific integrated circuits; DRAM chips; Electrodes; Electrons; Manufacturing; Random access memory; Testing; Transconductance; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference. Digest of Technical Papers. 1978 IEEE International

Conference_Location

San Francisco, CA, USA

Type

conf

DOI

10.1109/ISSCC.1978.1155774

Filename

1155774