DocumentCode :
2864662
Title :
Copper redistribution layer process for GaAs MMICs
Author :
Takatani, Shinichiro ; Hsiao, Tim ; Wu, Kay ; Chen, Yu-Chiao ; Jia-Shyan Wu ; Jung-Tao Chung ; Cheng-Kuo Lin ; Tsai, Shu-Hsiao
Author_Institution :
WIN Semiconductors Corp., Kuei Shan Hsiang, Tao Yuan Shien, Taiwan 333
fYear :
2012
fDate :
17-22 June 2012
Firstpage :
1
Lastpage :
3
Abstract :
A new copper metallization process is proposed that fabricates a redistribution layer on GaAs MMICs (monolithic microwave integrated circuits). This process enables the placement of Cu bonding pads and Cu pillar bumps over an MMIC. PBO (polybenzoxazole) is used as the low-k dielectric polymer for isolation. The thickness of the PBO layer is designed to be 10 mm in order to minimize the parasitic capacitance introduced by bonding pads placed on the active region of a HEMT (high electron mobility transistor). A single-pole double-throw HEMT switch fabricated by the proposed process exhibits good RF performance with negligible effect of the bonding pads.
Keywords :
Bonding; HEMTs; Heterojunction bipolar transistors; Irrigation; MMICs; Silicon; Voltage-controlled oscillators; Copper; GaAs; HEMT; MMIC; low-k; polymer; redistribution layer; switch;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
Conference_Location :
Montreal, QC
ISSN :
0149-645X
Print_ISBN :
978-1-4673-1085-7
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2012.6259484
Filename :
6259484
Link To Document :
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