Title :
Optical cleaning of lithium niobate crystals
Author :
Kösters, M. ; Sturman, B. ; Haertle, D. ; Buse, K.
Author_Institution :
Inst. of Phys., Univ. of Bonn, Bonn, Germany
Abstract :
For the optical cleaning, a Gaussian laser beam at 532 nm is focused onto the crystal. The 1/e-radius at the beam waist is 40 mum along the z- axis of the crystal. Afterwards, the impact of the cleaning treatment on the optical damage behavior of the crystals is inspected: A focused beam (1/e-radius of 20 mum) at 514 nm is directed onto the sample. After a 150- sec exposure at I2 =(103-104) W/cm2, the output beam profile is measured in two ways: First, a pinhole behind the sample blocks the stray light, and a photodiode records the power Pin. Second, a micro-disk blocks the beam center, so that the power Pout is recorded. The results after cleaning of a crystal with an intensity I2=15 W/cm2 for 340 h; the illuminating beam was moved for 1 mm in +z-direction during the cleaning treatment. The threshold of the optical damage is increased by more than three orders of magnitude due to the optical cleaning.
Keywords :
laser beams; laser materials processing; lithium compounds; micro-optics; optical focusing; optical materials; photodiodes; stray light; Gaussian laser beam; LiNbO3; laser focusing; lithium niobate crystal; microdisk block; optical cleaning; optical damage behavior; photodiode; size 40 mum; stray light; time 340 h; wavelength 514 nm; wavelength 532 nm; Cleaning; Crystals; Electron optics; Laser beams; Lithium niobate; Optical materials; Optical refraction; Optical variables control; Photovoltaic effects; Space charge;
Conference_Titel :
Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-4079-5
Electronic_ISBN :
978-1-4244-4080-1
DOI :
10.1109/CLEOE-EQEC.2009.5196476