Title :
Automatic Synthesis of Static Fault Trees from System Models
Author :
Xiang, Jianwen ; Yanoo, Kazuo ; Maeno, Yoshiharu ; Tadano, Kumiko
Author_Institution :
Service Platforms Res. Labs., NEC Corp., Kawasaki, Japan
Abstract :
Fault tree analysis (FTA) is a traditional reliability analysis technique. In practice, the manual development of fault trees could be costly and error-prone, especially in the case of fault tolerant systems due to the inherent complexities such as various dependencies and interactions among components. Some dynamic fault tree gates, such as Functional Dependency (FDEP) and Priority AND (PAND), are proposed to model the functional and sequential dependencies, respectively. Unfortunately, the potential semantic troubles and limitations of these gates have not been well studied before. In this paper, we describe a framework to automatically generate static fault trees from system models specified with SysML. A reliability configuration model (RCM) and a static fault tree model (SFTM) are proposed to embed system configuration information needed for reliability analysis and error mechanism for fault tree generation, respectively. In the SFTM, the static representations of functional and sequential dependencies with standard Boolean AND and OR gates are proposed, which can avoid the problems of the dynamic FDEP and PAND gates and can reduce the cost of analysis based on a combinatorial model. A fault-tolerant parallel processor (FTTP) example is used to demonstrate our approach.
Keywords :
fault tolerant computing; fault trees; logic gates; parallel processing; Boolean AND gate; OR gate; PAND gate; automatic synthesis; combinatorial model; dynamic FDEP gate; error mechanism; fault tolerant parallel processor; fault tolerant system; fault tree gate; fault tree generation; functional dependency; reliability analysis; reliability configuration model; sequential dependency; static fault tree analysis; static representation; Analytical models; Fault trees; Hardware; Logic gates; Markov processes; Reliability; Unified modeling language; Fault tree analysis; functional dependency; reliability analysis; sequential dependency; system model;
Conference_Titel :
Secure Software Integration and Reliability Improvement (SSIRI), 2011 Fifth International Conference on
Conference_Location :
Jeju Island
Print_ISBN :
978-1-4577-0780-3
Electronic_ISBN :
978-0-7695-4453-3
DOI :
10.1109/SSIRI.2011.32