Title :
Buried injector logic: Second generation I2L performance
Author_Institution :
Bell Laboratories, Reading, PA, USA
Abstract :
A vertically structured I2L gate, integrated with linear SBC processing, will be discussed. Previous (standard I2L) logic/linear function conflicts stemming from structural constraints have been reconciled, demonstrating second generation I2L performance with unrestrained SBC capability.
Keywords :
Circuit testing; Counting circuits; Epitaxial growth; Implants; Logic circuits; Logic devices; Logic testing; Rails; Solid state circuits; Substrates;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1978 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1978.1155812
